Max Planck Institute for Chemical Physics of Solids - Library Catalog

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X-ray microscopy Chris Jacobsen (Argonne National Laboratory, Illinois, Northwestern University, Illinois) by Series: Advances in microscopy and microanalysis
Material type: Text Text; Format: print
Language: English Publisher: Cambridge New York Port Melbourne New Delhi Singapore Cambridge University Press 2020
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Availability: Items available for loan: MPI CPfS (1)Call number: VG 8970 JACO.
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Transmission electron microscopy diffraction, imaging, and spectrometry C. Barry Carter, David B. Williams (eds.) by
Material type: Text Text; Format: print
Language: English Publisher: [Cham, Switzerland] Springer [2016]Copyright date: © 2016
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Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900 TRAN.
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Atomic force microscopy understanding basic modes and advanced applications Greg Haugstad by
Edition: 1. ed.
Material type: Text Text; Format: print
Language: English Publisher: Hoboken, NJ Wiley 2012
Other title:
  • AFM
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Availability: Items available for loan: MPI CPfS (1)Call number: UH 6320 HAUG.
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Scanning transmission electron microscopy imaging and analysis ed. by Stephen J. Pennycook; Peter D. Nellist by
Material type: Text Text; Format: print
Language: English
Publisher number:
  • 11665502
Publisher: New York, NY Heidelberg [u.a.] Springer 2011
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Availability: Not available: MPI CPfS: Checked out (1).
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Electron crystallography electron microscopy and electron diffraction Xiaodong Zou; Sven Hovmöller; Peter Oleynikov by Series: Texts on crystallography ; 16
Material type: Text Text; Format: print
Language: English Publisher: Oxford [u.a.] Oxford Univ. Press 2011
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Availability: Items available for loan: MPI CPfS (1)Call number: UQ 5500 ZOU.
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Introduction to texture analysis macrotexture, microtexture, and orientation mapping Olaf Engler; Valerie Randle by
Edition: 2. ed.
Material type: Text Text; Format: print
Language: English Publisher: Boca Raton, Fla. [u.a.] CRC Press c2010
Availability: Items available for loan: MPI CPfS (1)Call number: ZM 4100 ENGL.
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Advanced computing in electron microscopy Earl J. Kirkland by
Edition: 2. ed.
Material type: Text Text; Format: print
Language: English
Publisher number:
  • 12553044
Publisher: New York Heidelberg [u.a.] Springer 2010
Online resources:
Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900.0 KIRK.
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Aberration-corrected imaging in transmission electron microscopy an introduction Rolf Erni by
Material type: Text Text; Format: print
Language: English Publisher: London Imperial College Pr. 2010
Availability: Items available for loan: MPI CPfS (1)Call number: UH 6300 ERNI.
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Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin by
Material type: Text Text; Format: print
Language: English Publisher: New York, NY Springer 2009
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Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900 ECHL.
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Electron backscatter diffraction in materials science Adam J. Schwartz ... ed. by
Edition: 2. ed.
Material type: Text Text; Format: print
Language: English
Publisher number:
  • 12119400
Publisher: New York, NY Springer 2009
Online resources:
Availability: Items available for loan: MPI CPfS (1)Call number: UQ 5500 ELEC.
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Transmission electron microscopy a textbook for materials science David B. Williams ; C. Barry Carter by
Edition: 2. ed.
Material type: Text Text; Format: print
Language: English
Publisher number:
  • 11407898
Publisher: New York Springer 2009
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Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900 WILL.
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Introduction to scanning tunneling microscopy C. Julian Chen by Series: Monographs on the physics and chemistry of materials ; 64
Edition: 2. ed.
Material type: Text Text; Format: print
Language: English Publisher: Oxford [u.a.] Oxford University Press 2008
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Microstructural characterization of materials David Brandon and Wayne D. Kaplan, Technion, Israel Institute of Technology, Israel by Series: Quantitative software engineering series
Edition: 2nd edition
Material type: Text Text; Format: print
Language: English Publisher: Chichester John Wiley & Sons, Ltd [2008]Copyright date: © 2008
Online resources:
Availability: Items available for loan: MPI CPfS (1)Call number: UQ 8000 BRAN.
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Transmission electron microscopy physics of image formation L. Reimer; H. Kohl by Series: Springer series in optical sciences ; 36
Edition: 5. ed.
Material type: Text Text; Format: print
Language: English Publisher: New York, NY Springer 2008
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Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900 REIM.
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Transmission electron microscopy and diffractometry of materials Brent Fultz; James Howe by
Edition: 3. ed.
Material type: Text Text; Format: print
Language: English
Publisher number:
  • 12085156
Publisher: Berlin Heidelberg [u.a.] Springer 2008
Online resources:
Availability: Items available for loan: MPI CPfS (1)Call number: UH 6300 FULT.
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Elektronenmikroskopie eine anwendungsbezogene Einführung von Christian Colliex. Aus dem Franz. übers. und bearb. von Helmut Kohl by
Material type: Text Text; Format: print
Language: German Original language: French Publisher: Stuttgart Wiss. Verl.-Ges. c 2008
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Availability: Items available for loan: MPI CPfS (3)Call number: UH 6200 COLL +2, ...
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Optical imaging and microscopy techniques and advanced systems Peter Török; Fu-Jen Kao [ed.] by Series: Springer series in optical sciences ; 87
Edition: 2nd rev. ed.
Material type: Text Text; Format: print
Language: English
Publisher number:
  • 11965817
Publisher: Berlin Heidelberg [u.a.] Springer 2007
Online resources:
Availability: Items available for loan: MPI CPfS (1)Call number: UH 6700 OPTI.
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