Max Planck Institute for Chemical Physics of Solids - Library Catalog

X-ray microscopy Chris Jacobsen (Argonne National Laboratory, Illinois, Northwestern University, Illinois)

By: Material type: TextTextLanguage: English Series: Advances in microscopy and microanalysisPublisher: Cambridge New York Port Melbourne New Delhi Singapore Cambridge University Press 2020Description: xiv, 579 Seiten Illustrationen, DiagrammeContent type:
  • Text
Media type:
  • ohne Hilfsmittel zu benutzen
Carrier type:
  • Band
ISBN:
  • 9781107076570
Subject(s): Genre/Form: Additional physical formats: Erscheint auch als: X-ray microscopyDDC classification:
  • 502.8/2
LOC classification:
  • QH212.X2
Other classification:
  • VG 8970
  • 33.05
  • 33.18
Online resources: Summary: Inhaltsverzeichnis: X-ray microscopes : a short introduction -- A bit of history -- X-ray physics -- Imaging physics -- X-ray focusing optics -- X-ray microscope systems -- X-ray microscope instrumentation -- X-ray tomography -- X-ray spectromicroscopy -- Coherent imaging -- Radiation damage and cryo microscopy -- Applications, and future prospects.Summary: Klappentext: "Written by a pioneer in the field, this text provides a complete introduction to x-ray microscopy, providing all of the technical background required to use, understand and even develop x-ray microscopes. Starting from the basics of x-ray physics and focusing optics, it goes on to cover imaging theory, tomography, chemical and elemental analysis, lensless imaging, computational methods, instrumentation, radiation damage, and cryomicroscopy, and includes a survey of recent scientific applications. Designed as a 'one-stop' text, it provides a unified notation, and shows how computational methods in different areas are linked with one another. Including numerous derivations, and illustrated with dozens of examples throughout, this is an essential text for academics and practitioners across engineering, the physical sciences and the life sciences who use x-ray microscopy to analyze their specimens, as well as those taking courses in x-ray microscopy"--
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Holdings
Item type Current library Call number Materials specified Status Date due Barcode
Buch MPI CPfS VG 8970 JACO (Browse shelf(Opens below)) Available 8533-10

Includes bibliographical references and index

Inhaltsverzeichnis: X-ray microscopes : a short introduction -- A bit of history -- X-ray physics -- Imaging physics -- X-ray focusing optics -- X-ray microscope systems -- X-ray microscope instrumentation -- X-ray tomography -- X-ray spectromicroscopy -- Coherent imaging -- Radiation damage and cryo microscopy -- Applications, and future prospects.

Klappentext: "Written by a pioneer in the field, this text provides a complete introduction to x-ray microscopy, providing all of the technical background required to use, understand and even develop x-ray microscopes. Starting from the basics of x-ray physics and focusing optics, it goes on to cover imaging theory, tomography, chemical and elemental analysis, lensless imaging, computational methods, instrumentation, radiation damage, and cryomicroscopy, and includes a survey of recent scientific applications. Designed as a 'one-stop' text, it provides a unified notation, and shows how computational methods in different areas are linked with one another. Including numerous derivations, and illustrated with dozens of examples throughout, this is an essential text for academics and practitioners across engineering, the physical sciences and the life sciences who use x-ray microscopy to analyze their specimens, as well as those taking courses in x-ray microscopy"--

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