Max Planck Institute for Chemical Physics of Solids - Library Catalog

Scanning electron microscopy and X-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy

By: Contributor(s): Material type: TextTextLanguage: English Publisher: New York, NY, U.S.A. Springer [2018]Copyright date: © 2018Edition: Fourth editionDescription: XXIII, 550 Seiten Illustrationen, Diagramme 29 cmContent type:
  • Text
Media type:
  • ohne Hilfsmittel zu benutzen
Carrier type:
  • Band
ISBN:
  • 9781493966745
  • 9781493982691
Other title:
  • Abkürzungstitel SEMXM
  • Auf dem Buchdeckel Extras online
  • SEMXM
Subject(s): Additional physical formats: No title; No title; Erscheint auch als: Scanning electron microscopy and X-ray microanalysisDDC classification:
  • 620.11
LOC classification:
  • QH212.S3
Other classification:
  • UH 6310
  • UH 6320
  • VG 9900
  • 35.30
  • 33.61
  • 35.25
  • 51.30
  • 33.68
  • 33.18
  • 38.03
Online resources:
Contents:
Electron beam-specimen interactions -- Backscattered electrons -- Secondary electrons -- X-rays -- SEM instrumentation -- Image formation -- SEM image interpretation -- The visibility of features in SEM images -- Image defects -- High resolution imaging -- Low beam energy SEM -- Variable pressure SEM (VPSEM) -- ImageJ and Fiji -- SEM imaging checklist -- SEM case studies -- Energy dispersive X-ray spectrometry -- DTSA-II EDS software -- Qualitative elemental analysis by energy dispersive X-ray spectrometry -- Quantitative analysis -- Trace analysis by SEM/EDS -- Low beam energy X-ray microanalysis -- Analysis of specimens with special geometry -- Compositional mapping -- Attempting electron-excited X-ray microanalysis in the variable pressure scanning electron microscope (VPSEM) -- Energy dispersive X-ray microanalysis checklist -- Case studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused ion beam application in the SEM laboratory -- Ion beam microscopy
Tags from this library: No tags from this library for this title. Log in to add tags.
Holdings
Item type Current library Call number Materials specified Status Date due Barcode
Buch MPI CPfS VG 9900.0 SCAN (Browse shelf(Opens below)) Checked out 2025-07-31 8503-10

Hier auch später erschienene, unveränderte Nachdrucke

Electron beam-specimen interactions -- Backscattered electrons -- Secondary electrons -- X-rays -- SEM instrumentation -- Image formation -- SEM image interpretation -- The visibility of features in SEM images -- Image defects -- High resolution imaging -- Low beam energy SEM -- Variable pressure SEM (VPSEM) -- ImageJ and Fiji -- SEM imaging checklist -- SEM case studies -- Energy dispersive X-ray spectrometry -- DTSA-II EDS software -- Qualitative elemental analysis by energy dispersive X-ray spectrometry -- Quantitative analysis -- Trace analysis by SEM/EDS -- Low beam energy X-ray microanalysis -- Analysis of specimens with special geometry -- Compositional mapping -- Attempting electron-excited X-ray microanalysis in the variable pressure scanning electron microscope (VPSEM) -- Energy dispersive X-ray microanalysis checklist -- Case studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused ion beam application in the SEM laboratory -- Ion beam microscopy

Imprint

Data Protection Advice

© 2023 MPI CPfS / GWDG

Powered by Koha