Max Planck Institute for Chemical Physics of Solids - Library Catalog

Atomic force microscopy understanding basic modes and advanced applications Greg Haugstad

By: Material type: TextTextLanguage: English Publisher: Hoboken, NJ Wiley 2012Edition: 1. edDescription: XXII, 464 S. Ill., graph. Darst. 24 cmContent type:
  • Text
Media type:
  • ohne Hilfsmittel zu benutzen
Carrier type:
  • Band
ISBN:
  • 9780470638828
Other title:
  • AFM
Subject(s): Additional physical formats: Online-Ausg.: Atomic force microscopy; Erscheint auch als: Atomic force microscopy; Online-Ausg.: Atomic force microscopy; Erscheint auch als: Atomic force microscopyDDC classification:
  • 620/.5 23
LOC classification:
  • QH212.A78
Other classification:
  • UH 6320
  • 33.05
Online resources:
Contents:
Overview of AFM -- Distance-dependent interactions -- Z-dependent force measurements with AFM -- Topographic imaging -- Probing material properties I: phase imaging -- Probing material properties II: adhesive nanomechanics and mapping distance-dependent interactions -- Probing material properties III: lateral force methods -- Data post-processing and statistical analysis -- Spectral methods for measuring the normal cantilever spring constant K -- Derivation of Van der Waals force-distance expressions -- Derivation of energy dissipation expression, relationship to phase -- Relationships in meniscus geometry, circular approximation.
Action note:
  • 2
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Holdings
Item type Current library Call number Materials specified Status Date due Barcode
Buch MPI CPfS UH 6320 HAUG (Browse shelf(Opens below)) Available 10006479

Literaturangaben

Overview of AFM -- Distance-dependent interactions -- Z-dependent force measurements with AFM -- Topographic imaging -- Probing material properties I: phase imaging -- Probing material properties II: adhesive nanomechanics and mapping distance-dependent interactions -- Probing material properties III: lateral force methods -- Data post-processing and statistical analysis -- Spectral methods for measuring the normal cantilever spring constant K -- Derivation of Van der Waals force-distance expressions -- Derivation of energy dissipation expression, relationship to phase -- Relationships in meniscus geometry, circular approximation.

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