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		Scanning electron microscopy and X-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy by Goldstein, Joseph, 1939-2015 [VerfasserIn] Newbury, Dale E [VerfasserIn] Michael, Joseph R [VerfasserIn] Ritchie, Nicholas W. M [VerfasserIn] Scott, John Henry J [VerfasserIn] Joy, David C, 1943- [VerfasserIn] Edition: Fourth edition Material type: Text; Format: print Language: English Publisher: New York, NY, U.S.A. Springer [2018]Copyright date: © 2018 Other title: SEMXM Extras online SEMXM Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Cover Verlags-Info Availability: Not available: MPI CPfS: Checked out (1). Add to cart (remove)
		Transmission electron microscopy diffraction, imaging, and spectrometry C. Barry Carter, David B. Williams (eds.) by Carter, C. Barry [HerausgeberIn] Williams, David B, 1949- [HerausgeberIn] Thomas, John M, 1932-2020 [VerfasserIn eines Vorworts] Material type: Text; Format: print Language: English Publisher: [Cham, Switzerland] Springer [2016]Copyright date: © 2016 Online resources: Cover Inhaltsverzeichnis Inhaltsverzeichnis Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900 TRAN. Add to cart (remove)
		Electron crystallography electron microscopy and electron diffraction Xiaodong Zou; Sven Hovmöller; Peter Oleynikov by Zou, Xiaodong, 1964- [aut] Oleynikov, Peter [aut] Hovmöller, Sven, 1947- [aut] Series: Texts on crystallography ; 16 Material type: Text; Format: print Language: English Publisher: Oxford [u.a.] Oxford Univ. Press 2011 Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Availability: Items available for loan: MPI CPfS (1)Call number: UQ 5500 ZOU. Add to cart (remove)
		Introduction to texture analysis macrotexture, microtexture, and orientation mapping Olaf Engler; Valerie Randle by Engler, Olaf [aut] Randle, Valerie [aut] Edition: 2. ed. Material type: Text; Format: print Language: English Publisher: Boca Raton, Fla. [u.a.] CRC Press c2010 Availability: Items available for loan: MPI CPfS (1)Call number: ZM 4100 ENGL. Add to cart (remove)
		Advanced computing in electron microscopy Earl J. Kirkland by Kirkland, Earl J [aut] Edition: 2. ed. Material type: Text; Format: print Language: English Publisher number: 12553044 Publisher: New York Heidelberg [u.a.] Springer 2010 Online resources: Inhaltstext Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900.0 KIRK. Add to cart (remove)
		Electron crystallography [proceedings of the NATO Advanced Study Institute on Electron Crystallography, Erice, Sicily, 22 May - 2 June, 1997] ed. by Douglas L. Dorset ... by Dorset, Douglas L [Hrsg.] Advanced Study Institute on Electron Crystallography 1997 Erice [oth] Series: NATO NATO ASI series / E ; 347 Material type: Text; Format: print Language: English Publisher: Dordrecht Kluwer 2010 Online resources: Cover Availability: Items available for loan: MPI CPfS (1)Call number: UQ 5500 ELEC. Add to cart (remove)
		Aberration-corrected imaging in transmission electron microscopy an introduction Rolf Erni by Erni, Rolf, 1974- [aut] Material type: Text; Format: print Language: English Publisher: London Imperial College Pr. 2010 Availability: Items available for loan: MPI CPfS (1)Call number: UH 6300 ERNI. Add to cart (remove)
		Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin by Echlin, Patrick [aut] Material type: Text; Format: print Language: English Publisher: New York, NY Springer 2009 Online resources: Inhaltsverzeichnis Klappentext Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900 ECHL. Add to cart (remove)
		Electron backscatter diffraction in materials science Adam J. Schwartz ... ed. by Schwartz, Adam J [Hrsg.] Edition: 2. ed. Material type: Text; Format: print Language: English Publisher number: 12119400 Publisher: New York, NY Springer 2009 Online resources: Inhaltsverzeichnis Kapitel 2 Availability: Items available for loan: MPI CPfS (1)Call number: UQ 5500 ELEC. Add to cart (remove)
		Transmission electron microscopy a textbook for materials science David B. Williams ; C. Barry Carter by Williams, David B, 1949- [aut] Carter, C. Barry [aut] Edition: 2. ed. Material type: Text; Format: print Language: English Publisher number: 11407898 Publisher: New York Springer 2009 Online resources: Cover Kapitel 2 Inhaltsverzeichnis Einführung/Vorwort Inhaltsverzeichnis Inhaltsverzeichnis Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900 WILL. Add to cart (remove)
		Transmission electron microscopy physics of image formation L. Reimer; H. Kohl by Reimer, Ludwig, 1928- [aut] Kohl, Helmut, 1955- [aut] Series: Springer series in optical sciences ; 36 Edition: 5. ed. Material type: Text; Format: print Language: English Publisher: New York, NY Springer 2008 Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Cover Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900 REIM. Add to cart (remove)
		Transmission electron microscopy and diffractometry of materials Brent Fultz; James Howe by Fultz, Brent, 1955- [aut] Howe, James M, 1955- [aut] Edition: 3. ed. Material type: Text; Format: print Language: English Publisher number: 12085156 Publisher: Berlin Heidelberg [u.a.] Springer 2008 Online resources: Cover Availability: Items available for loan: MPI CPfS (1)Call number: UH 6300 FULT. Add to cart (remove)
		Elektronenmikroskopie eine anwendungsbezogene Einführung von Christian Colliex. Aus dem Franz. übers. und bearb. von Helmut Kohl by Colliex, Christian [aut] Colliex, Christian. La microscopie électronique <dt.> Kohl, Helmut, 1955- [Bearb.] Material type: Text; Format: print Language: German Original language: French Publisher: Stuttgart Wiss. Verl.-Ges. c 2008 Online resources: Inhaltstext Inhaltsverzeichnis Availability: Items available for loan: MPI CPfS (3)Call number: UH 6200 COLL +2, ... Add to cart (remove)
		Scanning microscopy for nanotechnology techniques and applications ed. by Weilie Zhou and Zhong Lin Wang by Zhou, Weilie [Hrsg.] Wang, Zhong Lin [oth] Material type: Text; Format: print Language: English Publisher number: 11349358 Publisher: New York, NY Springer 2007 Online resources: Cover Kapitel Einführung/Vorwort Inhaltsverzeichnis Publisher description Inhaltstext Availability: Items available for loan: MPI CPfS (1)Call number: UH 6300 SCAN. Add to cart (remove)
		Physical principles of electron microscopy an introduction to TEM, SEM and AEM Ray F. Egerton by Egerton, Ray [aut] Edition: [Nachdr.] Material type: Text; Format: print Language: English Publisher: New York, NY Springer 2007 Online resources: Cover Availability: Not available: MPI CPfS: Checked out (1). Add to cart (remove)
		High-energy electron diffraction and microscopy L.-M. Peng; S. L. Dudarev; M. J. Whelan by Peng, Lian-mao [aut] Whelan, M. J [oth] Dudarev, Sergej Leonidovič, 1951- [oth] Series: Monographs on the physics and chemistry of materials ; 61 Material type: Text; Format: print Language: English Publisher: Oxford [u.a.] Oxford Univ. Press 2004 Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Publisher description Availability: Items available for loan: MPI CPfS (1)Call number: UQ 5500 PENG. Add to cart (remove)
		Introduction to conventional transmission electron microscopy Marc De Graef by De Graef, Marc, 1961- [aut] Edition: 1. publ. Material type: Text; Format: print Language: English Publisher: Cambridge [u.a.] Cambridge Univ. Press 2003 Online resources: Publisher description Sample text Contributor biographical information Availability: Items available for loan: MPI CPfS (1)Call number: UH 6300 DE. Add to cart (remove)
		High-resolution electron microscopy John C.H. Spence by Spence, John C. H [aut] Series: Monographs on the physics and chemistry of materials ; 60 Edition: 3. ed. Material type: Text; Format: print Language: English Publisher: Oxford [u.a.] Oxford Univ. Press 2003 Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Publisher description Table of contents only Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900.0 SPEN. Add to cart (remove)
		Analytical electron microscopy for materials science D. Shindo; T. Oikawa by Shindo, Daisuke, 1953- [aut] Oikawa, Tetsuo [aut] Material type: Text; Format: print Language: English Publisher: Tokyo Berlin Heidelberg [u.a.] Springer 2002 Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Cover Availability: Items available for loan: MPI CPfS (1)Call number: UH 6300 SHIN. Not available: MPI CPfS: storniert (1). Add to cart (remove)
		Electron microscopy and analysis Peter J. Goodhew; John Humphreys; Richard Beanland by Goodhew, Peter J, 1943- [aut] Humphreys, F. J, 1941- [oth] Beanland, Richard [oth] Edition: 3. ed. Material type: Text; Format: print Language: English Publisher: London [u.a.] Taylor & Francis 2001 Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Publisher description Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900 GOOD. Add to cart (remove)