Max Planck Institute for Chemical Physics of Solids - Library Catalog

Physical principles of electron microscopy an introduction to TEM, SEM and AEM Ray F. Egerton

By: Material type: TextTextLanguage: English Publisher: New York, NY Springer 2007Edition: [Nachdr.]Description: XII, 202 S. Ill., graph. DarstContent type:
  • Text
Media type:
  • ohne Hilfsmittel zu benutzen
Carrier type:
  • Band
ISBN:
  • 9780387258003
Subject(s): Additional physical formats: Erscheint auch als: Physical Principles of Electron MicroscopyDDC classification:
  • 502
Other classification:
  • UH 6300
Online resources: Action note:
  • 3
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Item type Current library Call number Materials specified Status Date due Barcode
Buch MPI CPfS UH 6300 EGER (Browse shelf(Opens below)) Checked out 2025-07-31 10004888

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