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		Scanning electron microscopy and X-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy by Goldstein, Joseph, 1939-2015 [VerfasserIn] Newbury, Dale E [VerfasserIn] Michael, Joseph R [VerfasserIn] Ritchie, Nicholas W. M [VerfasserIn] Scott, John Henry J [VerfasserIn] Joy, David C, 1943- [VerfasserIn] Edition: Fourth edition Material type: Text; Format: print Language: English Publisher: New York, NY, U.S.A. Springer [2018]Copyright date: © 2018 Other title: SEMXM Extras online SEMXM Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Cover Verlags-Info Availability: Not available: MPI CPfS: Checked out (1). Add to cart (remove)
		Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin by Echlin, Patrick [aut] Material type: Text; Format: print Language: English Publisher: New York, NY Springer 2009 Online resources: Inhaltsverzeichnis Klappentext Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900 ECHL. Add to cart (remove)
		Electron backscatter diffraction in materials science Adam J. Schwartz ... ed. by Schwartz, Adam J [Hrsg.] Edition: 2. ed. Material type: Text; Format: print Language: English Publisher number: 12119400 Publisher: New York, NY Springer 2009 Online resources: Inhaltsverzeichnis Kapitel 2 Availability: Items available for loan: MPI CPfS (1)Call number: UQ 5500 ELEC. Add to cart (remove)
		Scanning microscopy for nanotechnology techniques and applications ed. by Weilie Zhou and Zhong Lin Wang by Zhou, Weilie [Hrsg.] Wang, Zhong Lin [oth] Material type: Text; Format: print Language: English Publisher number: 11349358 Publisher: New York, NY Springer 2007 Online resources: Cover Kapitel Einführung/Vorwort Inhaltsverzeichnis Publisher description Inhaltstext Availability: Items available for loan: MPI CPfS (1)Call number: UH 6300 SCAN. Add to cart (remove)
		Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer by Reimer, Ludwig, 1928- [aut] Series: Springer series in optical sciences ; 45 Edition: 2., completely rev. and updated ed. Material type: Text; Format: print Language: English Publisher: Berlin Heidelberg [u.a.] Springer 1998 Online resources: Cover Publisher description Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900.0 REIM. Add to cart (remove)
		In situ scanning electron microscopy in materials research ed. by Klaus Wetzig ... by Schulze, Dietrich [oth] Wetzig, Klaus, 1940- [Hrsg.] Edition: 1. ed. Material type: Text; Format: print Language: English Publisher: Berlin Akad.-Verl. [u.a.] 1995 Availability: Items available for loan: MPI CPfS (2)Call number: VG 9900.0 IN +2, ... Add to cart (remove)
		Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse Peter Fritz Schmidt ... by Schmidt, Peter Fritz [oth] Series: Kontakt & Studium ; 444 : Meßtechnik Material type: Text; Format: print Language: German Publisher: Renningen-Malmsheim expert-Verl. 1994 Online resources: Inhaltsverzeichnis Availability: Items available for loan: MPI CPfS (2)Call number: UH 6310 PRAX +2, ... Add to cart (remove)
		Scanning electron microscopy and X-ray microanalysis a text for biologists, materials scientists, and geologists Joseph I. Goldstein ... by Goldstein, Joseph, 1939-2015 [oth] Goldstein, Joseph, 1939-2015 [Hrsg.] Edition: 2. ed. Material type: Text; Format: print Language: English Publisher: New York [u.a.] Plenum Press 1992 Availability: Not available: MPI CPfS: Checked out (1). Add to cart (remove)
		Scanning electron microscopy, X-ray microanalysis, and analytical electron microscopy a laboratory workbook Charles E. Lyman ... by Lyman, Charles E [Hrsg.] Newbury, Dale E [oth] Goldstein, Joseph, 1939-2015 [oth] Williams, David B [oth] Romig, Alton D. Jr [oth] Armstrong, John T [oth] Echlin, Patrick [oth] Fiori, Charles E [oth] Joy, David C [oth] Lifshin, Eric [oth] Peters, Klaus-Ruediger [oth] Material type: Text; Format: print Language: English Publisher: New York [u.a.] Plenum Press 1990 Availability: Not available: MPI CPfS: Checked out (1). Add to cart (remove)

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