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		Scanning electron microscopy and X-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy by Goldstein, Joseph, 1939-2015 [VerfasserIn] Newbury, Dale E [VerfasserIn] Michael, Joseph R [VerfasserIn] Ritchie, Nicholas W. M [VerfasserIn] Scott, John Henry J [VerfasserIn] Joy, David C, 1943- [VerfasserIn] Edition: Fourth edition Material type: Text; Format: print Language: English Publisher: New York, NY, U.S.A. Springer [2018]Copyright date: © 2018 Other title: SEMXM Extras online SEMXM Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Cover Verlags-Info Availability: Not available: MPI CPfS: Checked out (1). Add to cart (remove)
		Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin by Echlin, Patrick [aut] Material type: Text; Format: print Language: English Publisher: New York, NY Springer 2009 Online resources: Inhaltsverzeichnis Klappentext Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900 ECHL. Add to cart (remove)
		Electron backscatter diffraction in materials science Adam J. Schwartz ... ed. by Schwartz, Adam J [Hrsg.] Edition: 2. ed. Material type: Text; Format: print Language: English Publisher number: 12119400 Publisher: New York, NY Springer 2009 Online resources: Inhaltsverzeichnis Kapitel 2 Availability: Items available for loan: MPI CPfS (1)Call number: UQ 5500 ELEC. Add to cart (remove)
		Introduction to scanning tunneling microscopy C. Julian Chen by Chen, C. Julian [aut] Series: Monographs on the physics and chemistry of materials ; 64 Edition: 2. ed. Material type: Text; Format: print Language: English Publisher: Oxford [u.a.] Oxford University Press 2008 Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Inhaltsverzeichnis Table of contents Availability: Not available: MPI CPfS: Checked out (1). Add to cart (remove)
		Scanning microscopy for nanotechnology techniques and applications ed. by Weilie Zhou and Zhong Lin Wang by Zhou, Weilie [Hrsg.] Wang, Zhong Lin [oth] Material type: Text; Format: print Language: English Publisher number: 11349358 Publisher: New York, NY Springer 2007 Online resources: Cover Kapitel Einführung/Vorwort Inhaltsverzeichnis Publisher description Inhaltstext Availability: Items available for loan: MPI CPfS (1)Call number: UH 6300 SCAN. Add to cart (remove)
		Advances in scanning probe microscopy T. Sakurai ... (eds.) by Watanabe, Yousuke [oth] Sakurai, Toshio [Hrsg.] Series: Advances in materials research ; 2 Material type: Text; Format: print Language: English Publisher: Berlin Heidelberg [u.a.] Springer 2000 Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Availability: Items available for loan: MPI CPfS (1)Call number: UP 1400 ADVA. Add to cart (remove)
		Scanning tunneling microscopy and its applications Chunli Bai by Bai, Chunli, 1953- [aut] Bai, Chunli, 1953-. Saomiao suidao xianweishu ji qi yingyong <engl.> Bai, Chunli, 1953-. Saomiao suidao xian weishu ji qi yingyong <engl.> Series: Physics and astronomy online library \| Springer series in surface sciences ; 32 Edition: 2., rev. ed. Material type: Text; Format: print Language: English Publisher: Berlin Heidelberg [u.a.] Springer 2000Publisher: Shanghai Shanghai Scientific & Technical Publishers 2000 Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Publisher description Availability: Items available for loan: MPI CPfS (1)Call number: UP 7500 SPRI -32. Add to cart (remove)
		Scanning probe microscopy analytical methods Roland Wiesendanger (ed.) by Wiesendanger, Roland, 1961- [Hrsg.] Series: NanoScience and technology Material type: Text; Format: print Language: English Publisher: Berlin Heidelberg [u.a.] Springer 1998 Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900.0 SCAN. Add to cart (remove)
		Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer by Reimer, Ludwig, 1928- [aut] Series: Springer series in optical sciences ; 45 Edition: 2., completely rev. and updated ed. Material type: Text; Format: print Language: English Publisher: Berlin Heidelberg [u.a.] Springer 1998 Online resources: Cover Publisher description Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900.0 REIM. Add to cart (remove)
		Surface analysis with STM and AFM experimental and theoretical aspects of image analysis Sergei N. Magonov; Myung-Hwan Whangbo by Magonov, Sergei N [aut] Whangbo, Myung-Hwan [oth] Hwangbo, Myŏng-hwan [oth] Material type: Text; Format: print Language: English Publisher: Weinheim [u.a.] VCH 1996 Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Availability: Items available for loan: MPI CPfS (1)Call number: UH 6320 MAGO. Add to cart (remove)
		Scanning tunneling microscopy 3 Theory of STM and related scanning probe methods / R. Wiesendanger .. by Wiesendanger, Roland, 1961- [oth] Series: Springer series in surface sciences ; 29 Edition: 2. ed. Material type: Text; Format: print Language: English Publisher: Berlin Springer 1996 Online resources: Inhaltsverzeichnis Availability: Items available for loan: MPI CPfS (1)Call number: UP 7500 SPRI -29. Add to cart (remove)
		In situ scanning electron microscopy in materials research ed. by Klaus Wetzig ... by Schulze, Dietrich [oth] Wetzig, Klaus, 1940- [Hrsg.] Edition: 1. ed. Material type: Text; Format: print Language: English Publisher: Berlin Akad.-Verl. [u.a.] 1995 Availability: Items available for loan: MPI CPfS (2)Call number: VG 9900.0 IN +2, ... Add to cart (remove)
		Scanning tunneling microscopy and its application Chunli Bai by Bai, Chunli, 1953- [aut] Bai, Chunli, 1953-. Saomiao-suidao-xianweishu-ji-qi-yingyong <engl.> Series: Springer series in surface sciences ; 32 Material type: Text; Format: print Language: English Original language: Chinese Publisher: [Shanghai] Shanghai Scientific and Technical Publ. 1995Publisher: Berlin Heidelberg [u.a.] Springer 1995 Online resources: Inhaltsverzeichnis Availability: Items available for loan: MPI CPfS (2)Call number: UP 7500 SPRI -32 +2, ... Add to cart (remove)
		Nanoscale characterization of surfaces and interfaces N. John DiNardo by DiNardo, Nicholas John [aut] Material type: Text; Format: print Language: English Publisher: Weinheim [u.a.] VCH 1994 Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Availability: Items available for loan: MPI CPfS (1)Call number: UP 7500 DINA. Add to cart (remove)
		Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse Peter Fritz Schmidt ... by Schmidt, Peter Fritz [oth] Series: Kontakt & Studium ; 444 : Meßtechnik Material type: Text; Format: print Language: German Publisher: Renningen-Malmsheim expert-Verl. 1994 Online resources: Inhaltsverzeichnis Availability: Items available for loan: MPI CPfS (2)Call number: UH 6310 PRAX +2, ... Add to cart (remove)
		Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid by Sarid, Dror, 1938- [aut] Series: Oxford series on optical sciences ; 5 Edition: Rev. ed. Material type: Text; Format: print Language: English Publisher: New York, NY [u.a.] Oxford Univ. Press 1994 Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Publisher description Table of contents Availability: Items available for loan: MPI CPfS (1)Call number: UH 6310 SARI. Add to cart (remove)
		Scanning tunneling microscopy and spectroscopy theory, techniques, and applications ed. Dawn A. Bonnell by Bonnell, Dawn A [Hrsg.] Material type: Text; Format: print Language: English Publisher: New York, NY [u.a.] VCH 1993 Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Availability: Items available for loan: MPI CPfS (1)Call number: UH 6320 SCAN. Add to cart (remove)
		Introduction to scanning tunneling microscopy C. Julian Chen by Chen, C. Julian [aut] Series: Oxford series on optical sciences ; 4 Material type: Text; Format: print Language: English Publisher: New York, NY [u.a.] Oxford Univ. Press 1993 Online resources: Inhaltsverzeichnis Publisher description Table of contents Availability: Items available for loan: MPI CPfS (1)Call number: UH 6320 CHEN. Add to cart (remove)
		Scanning tunneling microscopy Series: Springer series in surface sciences ; ... Material type: Set Language: English Publisher: Berlin [u.a.] Springer 1992- Availability: No items available. Add to cart (remove)
		Scanning electron microscopy and X-ray microanalysis a text for biologists, materials scientists, and geologists Joseph I. Goldstein ... by Goldstein, Joseph, 1939-2015 [oth] Goldstein, Joseph, 1939-2015 [Hrsg.] Edition: 2. ed. Material type: Text; Format: print Language: English Publisher: New York [u.a.] Plenum Press 1992 Availability: Not available: MPI CPfS: Checked out (1). Add to cart (remove)