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		Scanning electron microscopy and X-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy by Goldstein, Joseph, 1939-2015 [VerfasserIn] Newbury, Dale E [VerfasserIn] Michael, Joseph R [VerfasserIn] Ritchie, Nicholas W. M [VerfasserIn] Scott, John Henry J [VerfasserIn] Joy, David C, 1943- [VerfasserIn] Edition: Fourth edition Material type: Text; Format: print Language: English Publisher: New York, NY, U.S.A. Springer [2018]Copyright date: © 2018 Other title: SEMXM Extras online SEMXM Online resources: Inhaltsverzeichnis Inhaltsverzeichnis Cover Verlags-Info Availability: Not available: MPI CPfS: Checked out (1). Add to cart (remove)
		Electron probe quantitation [a result of a gathering on international experts in 1988 at ... National Institute of Standards and Technology, NIST] ed. by K. F. J. Heinrich and Dale E. Newbury by Heinrich, Kurt F. J [oth] Newbury, Dale E [oth] Heinrich, Kurt F [Hrsg.] Material type: Text; Format: print Language: English Publisher: New York [u.a.] Plenum Press 1991 Availability: Items available for loan: MPI CPfS (1)Call number: UH 6310 ELEC. Add to cart (remove)
		Scanning electron microscopy, X-ray microanalysis, and analytical electron microscopy a laboratory workbook Charles E. Lyman ... by Lyman, Charles E [Hrsg.] Newbury, Dale E [oth] Goldstein, Joseph, 1939-2015 [oth] Williams, David B [oth] Romig, Alton D. Jr [oth] Armstrong, John T [oth] Echlin, Patrick [oth] Fiori, Charles E [oth] Joy, David C [oth] Lifshin, Eric [oth] Peters, Klaus-Ruediger [oth] Material type: Text; Format: print Language: English Publisher: New York [u.a.] Plenum Press 1990 Availability: Not available: MPI CPfS: Checked out (1). Add to cart (remove)

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