Microstructural characterization of materials David Brandon and Wayne D. Kaplan, Technion, Israel Institute of Technology, Israel
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- 9780470027844
- 9780470027851
- 0470027843
- 0470027851
- 620.11299
- 620.1/1299
- TA417.23
- VE 9670
- UQ 8000
- UQ 5000
- ZM 3700
- 51.30
- 33.18
- 50.94
- 3
- 3
Item type | Current library | Call number | Materials specified | Status | Date due | Barcode | |
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Buch | MPI CPfS | UQ 8000 BRAN (Browse shelf(Opens below)) | Available | 10005154 |
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