Max Planck Institute for Chemical Physics of Solids - Library Catalog

Finden Sie nicht was Sie suchen? Machen Sie einen Anschaffungsvorschlag

Your search returned 111 results.

Sort
Results
Geometrical charged-particle optics Harald H. Rose by Series: Springer series in optical sciences ; 142
Edition: 1. ed.
Material type: Text Text; Format: print
Language: English
Publisher number:
  • 12321315
Publisher: Berlin Heidelberg Springer 2009
Availability: Items available for loan: MPI CPfS (1)Call number: UH 6200 ROSE.
Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin by
Material type: Text Text; Format: print
Language: English Publisher: New York, NY Springer 2009
Online resources:
Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900 ECHL.
Electron backscatter diffraction in materials science Adam J. Schwartz ... ed. by
Edition: 2. ed.
Material type: Text Text; Format: print
Language: English
Publisher number:
  • 12119400
Publisher: New York, NY Springer 2009
Online resources:
Availability: Items available for loan: MPI CPfS (1)Call number: UQ 5500 ELEC.
Transmission electron microscopy a textbook for materials science David B. Williams ; C. Barry Carter by
Edition: 2. ed.
Material type: Text Text; Format: print
Language: English
Publisher number:
  • 11407898
Publisher: New York Springer 2009
Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900 WILL.
Bonds and bands in semiconductors J.C. Phillips and Gerald Lucovsky by
Edition: 2. ed.
Material type: Text Text; Format: print
Language: English Publisher: New York, NY Momentum Press 2009
Availability: Not available: MPI CPfS: Checked out (1).
Bioelectrochemistry fundamentals, experimental techniques and applications edited by P.N. Bartlett by
Material type: Text Text; Format: print
Language: English Publisher: Chichester Wiley 2008
Availability: Items available for loan: MPI CPfS (1)Call number: VE 6300 BIOE.
Transmission electron microscopy physics of image formation L. Reimer; H. Kohl by Series: Springer series in optical sciences ; 36
Edition: 5. ed.
Material type: Text Text; Format: print
Language: English Publisher: New York, NY Springer 2008
Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900 REIM.
Core level spectroscopy of solids Frank de Groot; Akio Kotani by Series: Advances in condensed matter science ; 6
Material type: Text Text; Format: print
Language: English Publisher: Boca Raton, Fla. [u.a.] CRC Press 2008
Availability: Items available for loan: MPI CPfS (1)Call number: UP 9000 GROO +2. Not available: MPI CPfS: Checked out (2).
Transmission electron microscopy and diffractometry of materials Brent Fultz; James Howe by
Edition: 3. ed.
Material type: Text Text; Format: print
Language: English
Publisher number:
  • 12085156
Publisher: Berlin Heidelberg [u.a.] Springer 2008
Online resources:
Availability: Items available for loan: MPI CPfS (1)Call number: UH 6300 FULT.
Elektronenmikroskopie eine anwendungsbezogene Einführung von Christian Colliex. Aus dem Franz. übers. und bearb. von Helmut Kohl by
Material type: Text Text; Format: print
Language: German Original language: French Publisher: Stuttgart Wiss. Verl.-Ges. c 2008
Online resources:
Availability: Items available for loan: MPI CPfS (3)Call number: UH 6200 COLL +2, ...
Scanning microscopy for nanotechnology techniques and applications ed. by Weilie Zhou and Zhong Lin Wang by
Material type: Text Text; Format: print
Language: English
Publisher number:
  • 11349358
Publisher: New York, NY Springer 2007
Availability: Items available for loan: MPI CPfS (1)Call number: UH 6300 SCAN.
Physical principles of electron microscopy an introduction to TEM, SEM and AEM Ray F. Egerton by
Edition: [Nachdr.]
Material type: Text Text; Format: print
Language: English Publisher: New York, NY Springer 2007
Online resources:
Availability: Not available: MPI CPfS: Checked out (1).
Electronic correlation mapping from finite to extended systems Jamal Berakdar by
Material type: Text Text; Format: print
Language: English
Publisher number:
  • 1140350 000
Publisher: Weinheim Wiley-VCH 2006
Availability: Items available for loan: MPI CPfS (1)Call number: UK 2000 BERA.
Novel NMR and EPR techniques J. Dolinšek ... (eds.) by Series: Lecture notes in physics ; 684
Material type: Text Text; Format: print
Language: English
Publisher number:
  • 11540830
Publisher: Berlin Heidelberg New York, NY Springer 2006
Availability: Items available for loan: MPI CPfS (1)Call number: UD 8220 LECT -684.
Electrons and disorder in solids V.F. Gantmakher by Series: Oxford science publications | International series of monographs on physics ; 130
Edition: 1. publ.
Material type: Text Text; Format: print
Language: English Publisher: Oxford [u.a.] Clarendon Press 2005
Availability: Items available for loan: MPI CPfS (1)Call number: UQ 7360 GANT.
Hubbard operators in the theory of strongly correlated electrons S. G. Ovchinnikov; V. V. Valʹkov by
Material type: Text Text; Format: print
Language: English Publisher: London Imperial College Press 2004
Other title:
  • X-operators
Availability: Items available for loan: MPI CPfS (1)Call number: UP 3600 OVCH.
High-energy electron diffraction and microscopy L.-M. Peng; S. L. Dudarev; M. J. Whelan by Series: Monographs on the physics and chemistry of materials ; 61
Material type: Text Text; Format: print
Language: English Publisher: Oxford [u.a.] Oxford Univ. Press 2004
Availability: Items available for loan: MPI CPfS (1)Call number: UQ 5500 PENG.
Alkali-doped fullerides narrow-band solids with unusual properties Olle Gunnarsson by
Material type: Text Text; Format: print
Language: English Publisher: New Jersey [u.a.] World Scientific 2004
Availability: Items available for loan: MPI CPfS (2)Call number: Extern, ...
Electron correlation in metals K. Yamada by
Material type: Text Text; Format: print
Language: English Original language: Japanese Publisher: Cambridge [u.a.] Cambridge University Press 2004
Availability: Items available for loan: MPI CPfS (1)Call number: UP 3600 YAMA.
Pages
Not finding what you're looking for?

Imprint

Data Protection Advice

Powered by Koha