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Scanning microscopy for nanotechnology techniques and applications ed. by Weilie Zhou and Zhong Lin Wang

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Material type: Text

TextPublisher number: 11349358Language: English Publisher: New York, NY Springer 2007Description: XIV, 522 S. zahlr. Ill., graph. DarstContent type:

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Additional physical formats: Online-Ausg.: Scanning microscopy for nanotechnology; Erscheint auch als: Scanning Microscopy for NanotechnologyDDC classification:

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Holdings
Item type	Current library	Call number	Materials specified	Status	Date due	Barcode
Buch	MPI CPfS	UH 6300 SCAN (Browse shelf(Opens below))		Available		10004891

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Previous	UH 6300 REED Electron microprobe analysis and scanning electron microscopy in geology	UH 6300 SAMP -1 Sample preparation handbook for transmission electron microscopy [1] Methodology	UH 6300 SAMP -2 Sample preparation handbook for transmission electron microscopy [2] Techniques	UH 6300 SCAN Scanning microscopy for nanotechnology techniques and applications	UH 6300 SCAN Scanning transmission electron microscopy imaging and analysis	UH 6300 SHIN Analytical electron microscopy for materials science	UH 6300 SLAY Light and electron microscopy	Next

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