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Introduction to scanning tunneling microscopy C. Julian Chen

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TextLanguage: English Series: Monographs on the physics and chemistry of materials ; 64Publisher: Oxford [u.a.] Oxford University Press 2008Edition: 2. edDescription: LXIII, 423 Seiten Illustrationen 24cmContent type:

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Holdings
Item type	Current library	Call number	Materials specified	Status	Date due	Barcode
Buch	MPI CPfS	UH 6320 CHEN (Browse shelf(Opens below))		Checked out	2025-07-31	10004865

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Previous	UH 6310 PRAX +2 Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse	UH 6310 SARI Scanning force microscopy with applications to electric, magnetic, and atomic forces	UH 6320 CHEN Introduction to scanning tunneling microscopy	UH 6320 CHEN Introduction to scanning tunneling microscopy	UH 6320 HAUG Atomic force microscopy understanding basic modes and advanced applications	UH 6320 MAGO Surface analysis with STM and AFM experimental and theoretical aspects of image analysis	UH 6320 SCAN Scanning tunneling microscopy and spectroscopy theory, techniques, and applications	Next

Previous ed.: 1993

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