Thin film analysis by X-Ray scattering Mario Birkholz. With contributions by Paul F. Fewster ...
Material type:
TextPublisher number: 1131052 000Language: English Publisher: Weinheim WILEY-VCH c 2006Description: XXII, 356 S Ill., graph. Darst 25 cmContent type: - Text
- ohne Hilfsmittel zu benutzen
- Band
- 3527310525
- 9783527310524
- 530.4275
- 530
- QC176.83
- UP 7500
- 33.68
- 51.20
- Archivierung/Langzeitarchivierung gewährleistet PEBW
| Item type | Current library | Call number | Materials specified | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
| Buch | MPI CPfS | UP 7500 BIRK (Browse shelf(Opens below)) | Available | 10003590 |
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| UP 6900 MATE Materials science in static high magnetic fields | UP 6900 MOON Superconducting levitation applications to bearings and magnetic transportation | UP 6900 WILS Superconducting magnets | UP 7500 BIRK Thin film analysis by X-Ray scattering | UP 7500 DESJ Concepts in surface physics | UP 7500 DINA Nanoscale characterization of surfaces and interfaces | UP 7500 DÜNN Dünne Schichten und Schichtsysteme vom 3. bis 14. März 1986 in der Kernforschungsanlage Jülich |
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Archivierung/Langzeitarchivierung gewährleistet PEBW pdager DE-31