Max Planck Institute for Chemical Physics of Solids - Library Catalog

Thin film analysis by X-Ray scattering Mario Birkholz. With contributions by Paul F. Fewster ...

By: Contributor(s): Material type: TextTextPublisher number: 1131052 000Language: English Publisher: Weinheim WILEY-VCH c 2006Description: XXII, 356 S Ill., graph. Darst 25 cmContent type:
  • Text
Media type:
  • ohne Hilfsmittel zu benutzen
Carrier type:
  • Band
ISBN:
  • 3527310525
  • 9783527310524
Subject(s): Additional physical formats: Erscheint auch als: Thin film analysis by X-ray scatteringDDC classification:
  • 530.4275
  • 530
LOC classification:
  • QC176.83
Other classification:
  • UP 7500
  • 33.68
  • 51.20
Online resources: Action note:
  • Archivierung/Langzeitarchivierung gewährleistet PEBW
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Holdings
Item type Current library Call number Materials specified Status Date due Barcode
Buch MPI CPfS UP 7500 BIRK (Browse shelf(Opens below)) Available 10003590

Literaturangaben

Archivierung/Langzeitarchivierung gewährleistet PEBW pdager DE-31

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