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Electron microscopy and analysis Peter J. Goodhew; John Humphreys; Richard Beanland

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TextLanguage: English Publisher: London [u.a.] Taylor & Francis 2001Edition: 3. edDescription: X, 251 S. Ill., graph. DarstContent type:

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Additional physical formats: Online-Ausg.: Electron microscopy and analysis; Erscheint auch als: Electron Microscopy and Analysis.DDC classification:

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Holdings
Item type	Current library	Call number	Materials specified	Status	Date due	Barcode
Buch	MPI CPfS	VG 9900 GOOD (Browse shelf(Opens below))		Available		10001894

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Previous	VG 9900 CRYS +5 Crystal structure refinement a crystallographer's guide to SHELXL	VG 9900 ECHL Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis	VG 9900 EGER Electron energy-loss spectroscopy in the electron microscope	VG 9900 GOOD Electron microscopy and analysis	VG 9900 GUBI X-ray line profile analysis in materials science	VG 9900 KLUG X-ray diffraction procedures for polycrystalline and amorphous materials	VG 9900 KLUG +2 X-ray diffraction procedures for polycrystalline and amorphous materials	Next

Includes bibliographical references (p. [236] - 237) and index

Previous ed.: 1988

Archivierung prüfen 20240324 DE-4165 3 pdager

Archivierung prüfen 20250503 DE-640 3 pdager

Max Planck Institute for Chemical Physics of Solids - Library Catalog