X-ray diffraction at elevated temperatures a method for in situ process analysis D. D. L. Chung ...
Material type:
TextLanguage: English Publisher: New York Weinheim [u.a.] VCH 1993Description: VIII, 268 S. Ill., graph. DarstContent type: - Text
- ohne Hilfsmittel zu benutzen
- Band
- 3527278427
- 0895737450
- 548/.83
- 543
- QC482.D5
- 29
- UQ 5600
- VG 9900
- 58.13
- 51.30
- 35.25
- 33.19
- Archivierung/Langzeitarchivierung gewährleistet PEBW
- 3
| Item type | Current library | Call number | Materials specified | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
| Buch | MPI CPfS | VG 9900.1 XRAY (Browse shelf(Opens below)) | Available | 10002483 |
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| VG 9900.1 RHOD Crystallography made crystal clear a guide for users of macromolecular models | VG 9900.1 SHMU Introduction to crystallographic statistics | VG 9900.1 TIME Time-resolved diffraction | VG 9900.1 XRAY X-ray diffraction at elevated temperatures a method for in situ process analysis | VG 9901 DINN Rietveld refinement practical powder diffraction pattern analysis using TOPAS | VG 9901 DUNI X-ray analysis and the structure of organic molecules | VG 9901 STOU X-ray structure determination a practical guide |
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