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X-ray diffraction at elevated temperatures a method for in situ process analysis

X-ray diffraction at elevated temperatures a method for in situ process analysis D. D. L. Chung ... - VIII, 268 S. Ill., graph. Darst.

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ISBN: 3527278427 : DM 158.00 (Weinheim Pp.) 0895737450 (New York, NY ...)

Nat. Bib. No.: 93,A25,0800 dnb

Nat. Bib. Agency Control No.: b92V6252 UK 930879627 DE-101

Subjects--Topical Terms:
X-rays--Diffraction
Chemistry

Subjects--Index Terms: X-rays Industrial applications

LC Class. No.: QC482.D5

Dewey Class. No.: 548/.83 543

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Max Planck Institute for Chemical Physics of Solids - Library Catalog

X-ray diffraction at elevated temperatures a method for in situ process analysis