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_aHandbook of instrumentation and techniques for semiconductor nanostructure characterization _b[in two volumes] _ced.: Richard Haight; Frances M. Ross; James B. Hannon |
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_aSingapore [u.a.] _bWorld Scientific _c2012- |
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_aohne Hilfsmittel zu benutzen _bn _2rdamedia |
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_aMaterials and energy _v... |
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_aHaight, Richard _eHrsg. _4edt |
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_aRoss, Frances M. _d1964- _eHrsg. _0(DE-588)1126045977 _0(DE-627)880700343 _0(DE-576)34867693X _4edt |
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_aHannon, James B. _eHrsg. _4edt |
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