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_aX-ray optics and microanalysis _bproceedings of the 20th international congress, Karlsruhe, Germany, 15 - 18 September 2009 ; [ICXOM20] _ced. Melissa A. Denecke ... |
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_aMelville, NYk _bAmerican Inst. of Physics _c2010 |
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_aXIV, 214 S. _bIll., graph. Darst. |
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_aAIP conference proceedings _v1221 |
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| 500 | _aSponsoring organizations: Research Center Karlsruhe (FZK)-Program Nuclear | ||
| 505 | 8 | _aAdvances in instrumentation, detection, and methodology -- X-ray optics monochromators and multilayers, focusing optics -- Quantitative and multivariate analysis -- Imaging techniques and image processing -- Applications of nano-, micro-, and surface analysis techniques. | |
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