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Aberration-corrected electron microscopy ed. by Peter W. Hawkes

Contributor(s):

Hawkes, Peter W, 1937- [Hrsg.]

Material type: Text

TextLanguage: English Series: Advances in imaging and electron physics ; 153Publisher: Amsterdam Heidelberg [u.a.] Elsevier 2008Description: XV, 538, [32] S. Ill., graph. Darst. 23cmContent type:

Text

Media type:

ohne Hilfsmittel zu benutzen

Carrier type:

Band

ISBN:

9780123742209
012374220X

Subject(s):

DDC classification:

621.367

Action note:

Archivierung/Langzeitarchivierung gewährleistet PEBW DE-31

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Holdings ( 1 )
Title notes ( 1 )

Holdings
Item type	Current library	Call number	Materials specified	Status	Date due	Barcode
Buch	MPI CPfS	UH 6200 ABER (Browse shelf(Opens below))		Available		10006124

Archivierung/Langzeitarchivierung gewährleistet PEBW DE-31 pdager DE-90

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Aberration-corrected electron microscopy ed. by Peter W. Hawkes