Atomic and nuclear analytical methods XRF, Mössbauer, XPS, NAA and ion-beam spectroscopic techniques H. R. Verma
Material type:
- Text
- ohne Hilfsmittel zu benutzen
- Band
- 3540302778
- 9783540302773
- 530 530
- 530
- 530 540
- 530
- QC454.A8
- VG 8900
- 33.07
- 35.25
- Archivierung/Langzeitarchivierung gewährleistet PEBW
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- 3
Item type | Current library | Call number | Materials specified | Status | Date due | Barcode | |
---|---|---|---|---|---|---|---|
Buch | MPI CPfS | UP 9500 VERM (Browse shelf(Opens below)) | Available | 10004810 |
X-ray fluorescence (XRF) and particle-induced X-ray emission (PIXE) -- Rutherford backscattering spectroscopy -- Elastic recoil detection -- Mössbauer spectroscopy (MS) -- X-ray photoelectron spectroscopy -- Neutron activation analysis -- Nuclear reaction analysis and particle-induced gamma-ray emission -- Accelerator mass spectroscopy (AMS) -- Appendixes.
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