Max Planck Institute for Chemical Physics of Solids - Library Catalog

Scanning transmission electron microscopy imaging and analysis ed. by Stephen J. Pennycook; Peter D. Nellist

Contributor(s): Material type: TextTextPublisher number: 11665502Language: English Publisher: New York, NY Heidelberg [u.a.] Springer 2011Description: XII, 762 S. zahlr. Ill., graph. Darst. 254 mm x 178 mmContent type:
  • Text
Media type:
  • ohne Hilfsmittel zu benutzen
Carrier type:
  • Band
ISBN:
  • 1441971998
  • 9781441971999
Subject(s): Additional physical formats: No title; Online-Ausg.: Scanning Transmission Electron Microscopy; Erscheint auch als: Scanning transmission electron microscopyDDC classification:
  • 670
  • 670
Other classification:
  • UH 6300
  • 33.68
  • 51.20
Online resources: Action note:
  • Archivierung/Langzeitarchivierung gewährleistet PEBW DE-31
  • 1
  • Potenzieller Alleinbesitz Niedersachsen
Summary: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
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Item type Current library Call number Materials specified Status Date due Barcode
Buch MPI CPfS UH 6300 SCAN (Browse shelf(Opens below)) Checked out 2025-08-08 10006067

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Archivierung/Langzeitarchivierung gewährleistet PEBW DE-31 pdager DE-90

Archivierung prüfen 20240324 DE-4165 1 pdager

Archivierung/Langzeitarchivierung gewährleistet 20240722 NI-LastCopies Potenzieller Alleinbesitz Niedersachsen pdager DE-89

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