Max Planck Institute for Chemical Physics of Solids - Library Catalog

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Aberration-corrected electron microscopy ed. by Peter W. Hawkes by Series: Advances in imaging and electron physics ; 153
Material type: Text Text; Format: print
Language: English Publisher: Amsterdam Heidelberg [u.a.] Elsevier 2008
Availability: Items available for loan: MPI CPfS (1)Call number: UH 6200 ABER.
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Science of microscopy ed. by Peter W. Hawkes; John C. H. Spence by
Material type: Set Set
Language: English Publisher: New York, NY Springer 2007-
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