Max Planck Institute for Chemical Physics of Solids - Library Catalog

High resolution X-ray diffractometry and topography D. Keith Bowen and Brian K. Tanner

By: Contributor(s): Material type: TextTextLanguage: English Publisher: London [u.a.] Taylor & Francis 2001Edition: ReprDescription: X, 252 S. Ill., graph. DarstContent type:
  • Text
Media type:
  • ohne Hilfsmittel zu benutzen
Carrier type:
  • Band
ISBN:
  • 0850667585
DDC classification:
  • 548/.83
Other classification:
  • UQ 5600
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Holdings
Item type Current library Call number Materials specified Status Date due Barcode
Buch MPI CPfS UQ 5100 BOWE (Browse shelf(Opens below)) Available 10001181

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