Max Planck Institute for Chemical Physics of Solids - Library Catalog

Defect and microstructure analysis by diffraction Robert L. Snyder; Jaroslav Fiala; Hans J. Bunge

Contributor(s): Material type: TextTextLanguage: English Series: Internationale Union für Kristallographie IUCr monographs on crystallography ; 10Publisher: Oxford [u.a.] Oxford Univ. Press 1999Edition: 1. publDescription: XXII, 785 S. graph. DarstContent type:
  • Text
Media type:
  • ohne Hilfsmittel zu benutzen
Carrier type:
  • Band
ISBN:
  • 0198501897
Subject(s): Genre/Form: DDC classification:
  • 548.83
LOC classification:
  • QD945
Other classification:
  • UQ 5600
  • 38.31
Online resources: Action note:
  • 2
  • 3
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Holdings
Item type Current library Call number Materials specified Status Date due Barcode
Buch MPI CPfS UQ 5400 DEFE (Browse shelf(Opens below)) Available 10002247

Includes bibliographical references and index

Archivierung prüfen 20240324 DE-4165 2 pdager

Archivierung prüfen 20240511 DE-640 3 pdager

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