Max Planck Institute for Chemical Physics of Solids - Library Catalog

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Transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer by Series: Springer series in optical sciences ; 36
Edition: 4. ed.
Material type: Text Text; Format: print
Language: English Publisher: Berlin Heidelberg [u.a.] Springer 1997
Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900.0 REIM.
Video microscopy the fundamentals Shinya Inoué; Kenneth R. Spring by
Edition: 2. ed.
Material type: Text Text; Format: print
Language: English Publisher: New York London Plenum Press 1997
Availability: Items available for loan: MPI CPfS (1)Call number: VW 5050 INOU.
The principles and practice of electron microscopy Ian M. Watt by
Edition: 2. ed
Material type: Text Text; Format: print
Language: English Publisher: Cambridge [u.a.] Cambridge University Press 1997
Availability: Items available for loan: MPI CPfS (1)Call number: UH 6300 WATT.
Surface analysis with STM and AFM experimental and theoretical aspects of image analysis Sergei N. Magonov; Myung-Hwan Whangbo by
Material type: Text Text; Format: print
Language: English Publisher: Weinheim [u.a.] VCH 1996
Availability: Items available for loan: MPI CPfS (1)Call number: UH 6320 MAGO.
Scanning tunneling microscopy 3 Theory of STM and related scanning probe methods / R. Wiesendanger .. by Series: Springer series in surface sciences ; 29
Edition: 2. ed.
Material type: Text Text; Format: print
Language: English Publisher: Berlin Springer 1996
Online resources:
Availability: Items available for loan: MPI CPfS (1)Call number: UP 7500 SPRI -29.
Electron energy-loss spectroscopy in the electron microscope R. F. Egerton by
Edition: 2. ed.
Material type: Text Text; Format: print
Language: English Publisher: New York, NY [u.a.] Plenum Press 1996
Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900 EGER.
Transmission electron microscopy a textbook for materials science David B. Williams and C. Barry Carter by
Material type: Text Text; Format: print
Language: English Publisher: New York, NY [u.a.] Plenum Press 1996
Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900 WILL.
Energy-filtering transmission electron microscopy Ludwig Reimer (ed.). With contributions by C. Deininger ... by Series: Springer series in optical sciences ; 71
Material type: Text Text; Format: print
Language: English Publisher: Berlin Heidelberg [u.a.] Springer 1995
Other title:
  • Energy-filtering
Availability: Items available for loan: MPI CPfS (1)Call number: UH 6300 ENER.
In situ scanning electron microscopy in materials research ed. by Klaus Wetzig ... by
Edition: 1. ed.
Material type: Text Text; Format: print
Language: English Publisher: Berlin Akad.-Verl. [u.a.] 1995
Availability: Items available for loan: MPI CPfS (2)Call number: VG 9900.0 IN +2, ...
Scanning tunneling microscopy and its application Chunli Bai by Series: Springer series in surface sciences ; 32
Material type: Text Text; Format: print
Language: English Original language: Chinese Publisher: [Shanghai] Shanghai Scientific and Technical Publ. 1995Publisher: Berlin Heidelberg [u.a.] Springer 1995
Online resources:
Availability: Items available for loan: MPI CPfS (2)Call number: UP 7500 SPRI -32 +2, ...
Elastic and inelastic scattering in electron diffraction and imaging Zhong Lin Wang by
Material type: Text Text; Format: print
Language: English Publisher: New York London Plenum Press 1995
Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900 WANG.
Nanoscale characterization of surfaces and interfaces N. John DiNardo by
Material type: Text Text; Format: print
Language: English Publisher: Weinheim [u.a.] VCH 1994
Availability: Items available for loan: MPI CPfS (1)Call number: UP 7500 DINA.
Fundamentals of high-resolution transmission electron microscopy S. Horiuchi by
Material type: Text Text; Format: print
Language: English Publisher: Amsterdam [u.a.] North-Holland 1994
Availability: Items available for loan: MPI CPfS (1)Call number: VG 9900.0 HORI.
Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse Peter Fritz Schmidt ... by Series: Kontakt & Studium ; 444 : Meßtechnik
Material type: Text Text; Format: print
Language: German Publisher: Renningen-Malmsheim expert-Verl. 1994
Online resources:
Availability: Items available for loan: MPI CPfS (2)Call number: UH 6310 PRAX +2, ...
Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid by Series: Oxford series on optical sciences ; 5
Edition: Rev. ed.
Material type: Text Text; Format: print
Language: English Publisher: New York, NY [u.a.] Oxford Univ. Press 1994
Availability: Items available for loan: MPI CPfS (1)Call number: UH 6310 SARI.
Scanning tunneling microscopy and spectroscopy theory, techniques, and applications ed. Dawn A. Bonnell by
Material type: Text Text; Format: print
Language: English Publisher: New York, NY [u.a.] VCH 1993
Availability: Items available for loan: MPI CPfS (1)Call number: UH 6320 SCAN.
Introduction to scanning tunneling microscopy C. Julian Chen by Series: Oxford series on optical sciences ; 4
Material type: Text Text; Format: print
Language: English Publisher: New York, NY [u.a.] Oxford Univ. Press 1993
Availability: Items available for loan: MPI CPfS (1)Call number: UH 6320 CHEN.
Scanning tunneling microscopy Series: Springer series in surface sciences ; ...
Material type: Set Set
Language: English Publisher: Berlin [u.a.] Springer 1992-
Availability: No items available.
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