TY  - BOOK
AU  - Siegrist,Theo
TI  - X-Ray structure analysis
T2  - De Gruyter Textbook
SN  - 9783110610833
PY  - 2021///]
CY  - Berlin, Boston
PB  - De Gruyter
KW  - Technology & Engineering / Materials Science / General
KW  - SCIENCE / Physics / Crystallography
KW  - SCIENCE / Physics / Condensed Matter
KW  - SCIENCE / Spectroscopy & Spectrum Analysis
KW  - SCIENCE / Chemistry / Inorganic
KW  - Crystallography
KW  - X-ray diffraction
KW  - Symmetry
KW  - Group theory
KW  - Lehrbuch
KW  - gnd-content
N1  - Restricted Access; Controlled Vocabulary for Access Rights
N2  - Frontmatter -- Preface -- Contents -- 1 Introduction -- 2 Geometry and coordinate systems -- 3 Waves -- 4 Symmetry -- 5 Scattering and diffraction -- 6 X-ray physics -- 7 Single crystal methods -- 8 Powder diffraction methods -- 9 Qualitative and quantitative evaluation of powder patterns -- 10 Structure solution methods -- 11 Crystallographic information file -- Index; This book offers a compact overview on crystallography, symmetry, and applications of symmetry concepts. The author explains the theory behind scattering and diffraction of electromagnetic radiation. X-ray diffraction on single crystals as well as quantitative evaluation of powder patterns are discussed. The book also introduces applications of group theory and tensor properties of crystals
UR  - https://doi.org/10.1515/9783110610833
UR  - https://www.degruyterbrill.com/isbn/9783110610833
UR  - https://www.degruyterbrill.com/isbn/9783110610833
UR  - https://www.degruyterbrill.com/document/cover/isbn/9783110610833/original
UR  - https://www.degruyterbrill.com/document/cover/isbn/9783110610833/original
ER  -