TY  - BOOK
AU  - Gubicza,Jenö
TI  - X-ray line profile analysis in materials science
T2  - Research essentials
SN  - 1466658525
AV  - TA417.25 
U1  - 620.1/1272 23
PY  - 2014///
CY  - Hershey, Pa.
PB  - Engineering Science Reference/IGI Globa
KW  - Radiography, Industrial
KW  - Materials
KW  - Testing
KW  - X-rays
KW  - Industrial applications
N1  - Literaturangaben
UR  - http://www.gbv.de/dms/tib-ub-hannover/780105796.pdf
ER  -