TY  - BOOK
AU  - Haugstad,Greg
TI  - Atomic force microscopy: understanding basic modes and advanced applications
SN  - 9780470638828
AV  - QH212.A78 
U1  - 620/.5 23
PY  - 2012///
CY  - Hoboken, NJ
PB  - Wiley
KW  - Atomic force microscopy
N1  - Literaturangaben; Overview of AFM -- Distance-dependent interactions -- Z-dependent force measurements with AFM -- Topographic imaging -- Probing material properties I: phase imaging -- Probing material properties II: adhesive nanomechanics and mapping distance-dependent interactions -- Probing material properties III: lateral force methods -- Data post-processing and statistical analysis -- Spectral methods for measuring the normal cantilever spring constant K -- Derivation of Van der Waals force-distance expressions -- Derivation of energy dissipation expression, relationship to phase -- Relationships in meniscus geometry, circular approximation
UR  - http://www.loc.gov/catdir/enhancements/fy1210/2012003429-d.html
UR  - http://www.loc.gov/catdir/enhancements/fy1215/2012003429-b.html
UR  - http://www.loc.gov/catdir/enhancements/fy1215/2012003429-t.html
UR  - https://swbplus.bsz-bw.de/bsz37210651xcov.jpg
ER  -