Aberration-corrected electron microscopy 
ed. by Peter W. Hawkes 
 - XV, 538, [32] S.  Ill., graph. Darst.  23cm 
 - Advances in imaging and electron physics  153 .
 - Advances in imaging and electron physics  153 .
<br/><br/><label>ISBN: </label>9780123742209 012374220X  (hbk.) : £110.00 hbk. : £110.00 : CIP entry (Dec.) 
<br/><br/><label>Nat. Bib. Agency Control No.: </label>b8B1384  UK 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Optoelectronic devices<br/>Optical data processing
<br/><br/><label>Dewey Class. No.: </label>621.367