X-ray optics and microanalysis  proceedings of the 20th international congress, Karlsruhe, Germany, 15 - 18 September 2009 ; [ICXOM20] 
ed. Melissa A. Denecke ... 
 - XIV, 214 S.  Ill., graph. Darst. 
 - AIP conference proceedings  1221 .
 - American Institute of Physics  AIP conference proceedings  1221 .
<br/><br/> Sponsoring organizations: Research Center Karlsruhe (FZK)-Program Nuclear  
<br/><br/>Advances in instrumentation, detection, and methodology -- X-ray optics monochromators and multilayers, focusing optics -- Quantitative and multivariate analysis -- Imaging techniques and image processing -- Applications of nano-, micro-, and surface analysis techniques. 
<br/><br/><label>ISBN: </label>9780735407640 
<br/><br/><label>LCCN: </label>2011499270 
<br/><br/><label>Subjects--Topical Terms: </label><br/>X-ray optics--Congresses<br/>Materials--Microscopy--Congresses<br/>X-ray microanalysis--Congresses<br/>X-ray microscopes--Congresses
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Konferenzschrift<br/>Konferenzschrift
<br/><br/><label>LC Class. No.: </label>TA1775