Shindo, Daisuke  1953- <br/><br/>
Analytical electron microscopy for materials science 
D. Shindo; T. Oikawa 
 - IX, 152 S  Ill., graph. Darst  27 cm 
<br/><br/> Literaturangaben. - Aus dem Japan. übers 
<br/><br/><label>ISBN: </label>4431703365  kart. : EUR 85.55 
<br/><br/><label>Standard No.: </label>9784431703365 
<br/><br/><label>Nat. Bib. No.: </label>02,A47,1158  dnb 
<br/><br/><label>Nat. Bib. Agency Control No.: </label>4431703365  UK 96546069X  DE-101 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials--Microscopy<br/>Electron microscopy
<br/><br/><label>LC Class. No.: </label>TA417.23 
<br/><br/><label>Dewey Class. No.: </label>620.11299