TY  - BOOK
AU  - Echlin,Patrick
TI  - Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis
SN  - 9780387857305
AV  - QH212.S3 
U1  - 502.285 
PY  - 2009///
CY  - New York, NY
PB  - Springer
KW  - Scanning electron microscopy
KW  - X-ray microanalysis
KW  - Technique
N1  - Literaturverz. S. 317 - 322
UR  - https://swbplus.bsz-bw.de/bsz287520382inh.htm
UR  - http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=017081073&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA
ER  -