TY  - BOOK
AU  - Brandon,David G.
AU  - Kaplan,Wayne D.
TI  - Microstructural characterization of materials
T2  - Quantitative software engineering series
SN  - 9780470027844
AV  - TA417.23 
U1  - 620.11299 
PY  - 2008///]
CY  - Chichester
PB  - John Wiley & Sons, Ltd
KW  - Materials
KW  - Microscopy
KW  - Microstructure
N1  - Literaturangaben
UR  - http://www.gbv.de/dms/ilmenau/toc/546682111.PDF
UR  - http://www.loc.gov/catdir/enhancements/fy0827/2007041704-d.html
UR  - http://www.loc.gov/catdir/enhancements/fy0827/2007041704-t.html
ER  -