Egerton, Ray <br/><br/>
Physical principles of electron microscopy  an introduction to TEM, SEM and AEM 
Ray F. Egerton 
 - [Nachdr.] 
 - XII, 202 S.  Ill., graph. Darst. 
<br/><br/><label>ISBN: </label>9780387258003 
<br/><br/><label>Standard No.: </label>9780387258003 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopy
<br/><br/><label>Dewey Class. No.: </label>502