TY  - BOOK
AU  - Pecharsky,Vitalij K.
AU  - Zavalij,Peter Y.
TI  - Fundamentals of powder diffraction and structural characterization of materials
SN  - 0387241477
AV  - QC482.D5P43 2005 
U1  - 548.83 
PY  - 2005///
CY  - New York, NY
PB  - Springer
KW  - X-rays
KW  - Diffraction
KW  - Measurement
KW  - Powders
KW  - Optical properties
KW  - X-ray crystallography
N1  - Originally published: Boston : Kluwer Academic Publishers, c2003; Includes bibliographical references and index
UR  - https://swbplus.bsz-bw.de/bsz119433885cov.jpg
UR  - http://www.loc.gov/catdir/enhancements/fy0663/2005042474-d.html
UR  - http://www.loc.gov/catdir/enhancements/fy0824/2005042474-t.html
ER  -