TY  - BOOK
AU  - Birkholz,Mario
AU  - Fewster,Paul F.
AU  - Genzel, Christoph
TI  - Thin film analysis by X-Ray scattering
SN  - 3527310525
AV  - QC176.83 
U1  - 530.4275 
PY  - 2006///
CY  - Weinheim
PB  - WILEY-VCH
KW  - Thin films
KW  - X-ray spectroscopy
N1  - Literaturangaben
UR  - http://www.gbv.de/dms/ilmenau/toc/477547842birkh.PDF
UR  - https://swbplus.bsz-bw.de/bsz116714395cov.jpg
UR  - http://www.loc.gov/catdir/enhancements/fy0653/2006482582-d.html
UR  - http://www.loc.gov/catdir/enhancements/fy0653/2006482582-t.html
ER  -