Birkholz, Mario <br/><br/>
Thin film analysis by X-Ray scattering 
Mario Birkholz. With contributions by Paul F. Fewster ... 
 - XXII, 356 S  Ill., graph. Darst  25 cm 
<br/><br/> Literaturangaben 
<br/><br/><label>ISBN: </label>3527310525  Gb. : ca. EUR 119.00 (freier Pr.) 9783527310524 
<br/><br/><label>Standard No.: </label>9783527310524 1131052 000 
<br/><br/><label>Publisher. No.: </label>1131052 000 
<br/><br/><label>LCCN: </label>2006482582 
<br/><br/><label>Nat. Bib. No.: </label>05,N05,1062  dnb 
<br/><br/><label>Nat. Bib. Agency Control No.: </label>013206703  UK 973333952  DE-101 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Thin films<br/>X-ray spectroscopy
<br/><br/><label>LC Class. No.: </label>QC176.83 
<br/><br/><label>Dewey Class. No.: </label>530.4275 530