A practical guide for the preparation of specimens for x-ray fluorescence and x-ray diffraction analysis 
 Preparation of specimens for x-ray fluorescence and x-ray diffraction analysis 
ed. by Victor E. Buhrke (The Buhrke Company), Ron Jenkins (International Centre for Diffraction Data), Deane K. Smith (Pennsylvania State University) 
 - xxiv, 333 Seiten  Illustrationen, Diagramme  24 cm 
<br/><br/> Includes bibliographical references 
<br/><br/><label>ISBN: </label>0471194581 
<br/><br/><label>Nat. Bib. Agency Control No.: </label>b97W7343  UK 
<br/><br/><label>Dewey Class. No.: </label>543.08586