TY  - BOOK
AU  - Schroder,Dieter K.
TI  - Semiconductor material and device characterization
T2  - A Wiley-Interscience publication
SN  - 9780471241393
AV  - QC611 
U1  - 621.38152 
PY  - 1998///
CY  - New York, Weinheim [u.a.]
PB  - Wiley
KW  - Semiconductors
KW  - Testing
N1  - Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/bios/wiley047/97052094.html
UR  - http://www.loc.gov/catdir/description/wiley032/97052094.html
ER  -