Defect and microstructure analysis by diffraction 
Robert L. Snyder; Jaroslav Fiala; Hans J. Bunge 
 - 1. publ. 
 - XXII, 785 S.  graph. Darst. 
 - IUCR monographs on crystallography  10 .
 - Internationale Union für Kristallographie  IUCr monographs on crystallography  10 .
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>0198501897 
<br/><br/><label>Standard No.: </label>9780198501893 199-28971 
<br/><br/><label>LCCN: </label>99028971  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Crystals--Defects--Analysis<br/>Diffraction<br/>X-ray crystallography
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Aufsatzsammlung<br/>Aufsatzsammlung
<br/><br/><label>LC Class. No.: </label>QD945 
<br/><br/><label>Dewey Class. No.: </label>548.83