TY  - BOOK
AU  - Spaeth,Johann-Martin
AU  - Overhof,Harald
TI  - Point defects in semiconductors and insulators: determination of atomic and electronic structure from paramagnetic hyperfine interactions
T2  - Springer series in materials science
SN  - 3540426957
AV  - TK7871.852 
U1  - 621.38152 
PY  - 2003///
CY  - Berlin, Heidelberg [u.a.]
PB  - Springer
KW  - Semiconductors
KW  - Defects
KW  - Testing
KW  - Methodology
KW  - Nuclear magnetic resonance spectroscopy
N1  - Literaturverz. S. [467] - 484
UR  - https://swbplus.bsz-bw.de/bsz103687300inh.htm
UR  - https://swbplus.bsz-bw.de/bsz103687300cov.jpg
UR  - http://www.loc.gov/catdir/enhancements/fy0813/2002042592-d.html
ER  -