Spaeth, Johann-Martin  1937- <br/><br/>
Point defects in semiconductors and insulators  determination of atomic and electronic structure from paramagnetic hyperfine interactions 
J.-M. Spaeth; H. Overhof 
 - XI, 490 S  Ill., graph. Darst 
 - Springer series in materials science  51 Physics and astronomy online library .
 - Springer series in materials science  51 .
<br/><br/>Literaturverz. S. [467] - 484 
<br/><br/><label>ISBN: </label>3540426957  alk. paper : EUR 106.95 9783642627224 
<br/><br/><label>Standard No.: </label>9783540426950 2002-42592 
<br/><br/><label>LCCN: </label>2002042592 
<br/><br/><label>Nat. Bib. Agency Control No.: </label>3540426957  UK 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Defects<br/>Semiconductors--Testing--Methodology<br/>Nuclear magnetic resonance spectroscopy
<br/><br/><label>LC Class. No.: </label>TK7871.852 
<br/><br/><label>Dewey Class. No.: </label>621.38152 621.3815/2