TY  - BOOK
AU  - Fultz,Brent
AU  - Howe,James M.
TI  - Transmission electron microscopy and diffractometry of materials
T2  - Physics and astronomy online library
SN  - 3540678417
AV  - TA417.23 
U1  - 620.1/1299 
PY  - 2001///
CY  - Berlin, Heidelberg, New York, Barcelona, Hong Kong, London, Milan, Paris, Singapore, Tokyo
PB  - Springer
KW  - Transmission electron microscopy
KW  - X-rays
KW  - Diffraction
KW  - Materials
KW  - Microscopy
KW  - X-ray diffractometer
KW  - Lehrbuch
KW  - gnd-content
N1  - Literaturangaben
UR  - https://swbplus.bsz-bw.de/bsz089769309inh.htm
UR  - https://swbplus.bsz-bw.de/bsz089769309cov.jpg
ER  -