Goodhew, Peter J.  1943- <br/><br/>
Electron microscopy and analysis 
Peter J. Goodhew; John Humphreys; Richard Beanland 
 - 3. ed. 
 - X, 251 S.  Ill., graph. Darst. 
<br/><br/> Includes bibliographical references (p. [236] - 237) and index  Previous ed.: 1988 
<br/><br/><label>ISBN: </label>0748409688  (pbk. : alk. paper) 
<br/><br/><label>Standard No.: </label>9780748409686 
<br/><br/><label>LCCN: </label>00037716  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopy
<br/><br/><label>LC Class. No.: </label>QH212.E4 
<br/><br/><label>Dewey Class. No.: </label>502/.8/25 502.825