TY  - BOOK
AU  - Runyan,W.R.
AU  - Shaffner,T.J.
TI  - Semiconductor measurements and instrumentation
SN  - 0070576971
U1  - 621.381520287 
PY  - 1998///
CY  - New York [u.a.]
PB  - McGraw-Hill
KW  - Semiconductors
KW  - Physical measurements
UR  - http://www.gbv.de/dms/ilmenau/toc/232238669.PDF
ER  -