Reimer, Ludwig  1928- <br/><br/>
Scanning electron microscopy  physics of image formation and microanalysis 
Ludwig Reimer 
 - 2., completely rev. and updated ed. 
 - XIV, 527 S  Ill., graph. Darst 
 - Springer series in optical sciences  45 .
 - Springer series in optical sciences  45 .
<br/><br/> Hier auch später erschienene, unveränderte Nachdrucke 
<br/><br/><label>ISBN: </label>3540639764   (Gb.) 9783642083723 
<br/><br/><label>Standard No.: </label>9783642083723 9783540639763 
<br/><br/><label>LCCN: </label>98026178  
<br/><br/><label>Nat. Bib. No.: </label>98,N34,0443  dnb 98,A47,0832  dnb 
<br/><br/><label>Nat. Bib. Agency Control No.: </label>953703797  DE-101 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning electron microscopy
<br/><br/><label>LC Class. No.: </label>QH212.S3 
<br/><br/><label>Dewey Class. No.: </label>502.825 502/.8/25 535/.3325