TY  - BOOK
AU  - Bai,Chunli
AU  - Bai,Chunli
TI  - Scanning tunneling microscopy and its application
T2  - Springer series in surface sciences
SN  - 3540593462
AV  - QC173.4.S94 
U1  - 502/.8/25 
PY  - 1995///
CY  - [Shanghai]
PB  - Shanghai Scientific and Technical Publ.
KW  - Scanning tunneling microscopy
KW  - Surfaces (Physics)
KW  - Surface chemistry
N1  - Aus dem Chines. übers
UR  - http://www.gbv.de/dms/ilmenau/toc/186540345.PDF
ER  -