TY  - BOOK
AU  - Sarid,Dror
TI  - Scanning force microscopy: with applications to electric, magnetic, and atomic forces
T2  - Oxford series in optical and imaging sciences
SN  - 019509204X
AV  - QH212.S32 
U1  - 502/.8/2 
PY  - 1994///
CY  - New York, NY [u.a.]
PB  - Oxford Univ. Press
KW  - Scanning force microscopy
KW  - Surfaces (Physics)
N1  - Previous ed.: 1991. - Literaturverz. S. 233 - 259
UR  - http://www.gbv.de/dms/ilmenau/toc/148140963.PDF
UR  - http://www.loc.gov/catdir/enhancements/fy0603/94003081-d.html
UR  - http://www.loc.gov/catdir/enhancements/fy0603/94003081-t.html
ER  -